应用激光侧向散射测量粒径分布的理论研究  

Study of Laser Lateral Scattering Used to Measure Particle Size Distribution

作　　者：张志伟[1] 卫敬明[1] 郑刚 王乃宁[1] 

机构地区：[1]上海理工大学动力学院

出　　处：《中国激光》1998年第11期1040-1044,共5页Chinese Journal of Lasers

摘　　要：提出一种新型的颗粒测量方法，基于Ｍｉｅ散射理论，从另一独特的视角接收大角度的侧向散射光，并建立新的理论模型，可使测量下限扩展，技术要求有所改善。结合目前已经成熟的半导体激光和ＣＣＤ技术，运用此原理可使颗粒测量仪器向更轻便。This paper puts forward a method based on Mie scattering theory, which detects the lateral scattering light from a new view point. A novel theoretical calculation model is established. According to this principle the measuring range of particle sizes is extended while technical requirements are reduced. Combining with mature semiconductor lasers and the CCD image technique, this method will make the particle sizer portable and more sensitive.

关 键 词：侧向散射 粒径分布 条形阵列 光敏二极管 

分 类 号：TN240.6[电子电信—物理电子学] TH744.501[机械工程—光学工程]