考虑不同层材料折射率差时的谐振腔增强型光电探测器分析  

Analysis of Resonant Cavity Enhanced Photodetectors Considering the Inter layer Refractive Index Differences

作　　者：刘凯[1] 黄永清[1] 任晓敏[1] 

机构地区：[1]北京邮电大学

出　　处：《光电子．激光》1998年第5期360-363,371,共5页Journal of Optoelectronics·Laser

基　　金：国家杰出青年科学基金;国家教委留学回国人员科研启动基金

摘　　要：本文着重探讨了在考虑组成器件的不同层材料之间的折射率差时，对器件的性能进行分析的方法，并与ＫａｔｓｕｍｉＫｉｓｈｉｎｏ和Ｍ．ＳｅｌｉｍＵｎｌü提出的分析方法进行了比较。指出当折射率相差较小时（＜±０．６），两种分析方法所得出的最佳峰值量子效率随折射率的变化特性极为近似，但在响应光谱结构上存在着差别；而当折射率相差较大时，采用两种分析方法所得结果之间的差别很大。Great efforts have been made on the research and development of resonant cavity enhanced photodetectors since the structure was proposed by Katsumi Kishino and M.Selim nlü in 1991.Based on all these works,a new analysis method,considering the refractive index differences between different layers of the structure,is presented in this paper.In comparison with the former method established by Katsumi Kishino and M.Selim nlü,our analysis leads to little difference in calculated maximum quantum efficiency but an obvious one in calculated optical response spectrum for small inter layer refractive index differences (<±0.6).Whereas for large inter layer refractive index differences,remarkable differences in both aspects of the above mentioned characteristics are resulted.Our analysis shows better agreement with experiments.

关 键 词：谐振腔 光电探测器 波长选择 调谐 

分 类 号：TN815.02[电子电信—信息与通信工程] TN204