电荷耦合器件像质评价的实验研究  

Testing Study of Imaging Quality Evaluating of Charge Coupled Device

作　　者：王利平[1] 刘滨[1] 周建勋[1] 张保民[1] 

机构地区：[1]南京理工大学

出　　处：《光电子．激光》1998年第5期396-398,共3页Journal of Optoelectronics·Laser

摘　　要：本文运用图象积分抽样理论，并利用刀口响应方法来对ＣＣＤ像质进行了完整评价。用真频传递能力、混淆效应、信息密度等示性参数准确表征了ＣＣＤ的成像特性。In this paper,the imaging quality of CCD is intactly evaluated,according to the theory of integral sampling in optics,and using edge response.The imaging characteristics of CCD are accuratly characterized by the parameters of real frequency transfer ability,confusing effect and information density etc.Testing resules of CCD linear array are presented.

关 键 词：电荷耦合器件 测试 像质评价 

分 类 号：TN386.507[电子电信—物理电子学]