基于软件过程度量的正交缺陷分类技术  

Orthogonal Defect Classification Technology Based on Software Process Measurement

作　　者：李新军[1] 刘晓明[1] 黄松[1] 

机构地区：[1]解放军理工大学指挥自动化学院,南京210007

出　　处：《计算机工程》2009年第23期30-31,34,共3页Computer Engineering

摘　　要：软件过程是否有效是评估软件产品质量和提高组织软件能力成熟度的重要依据。给出软件过程有效性量化测量的正交缺陷分类(ODC)技术。介绍ODC的概念、发展过程、总体结构和各种ODC缺陷属性的含义,阐述使用ODC度量开发和识别过程中的问题,对ODC的应用和实施进行分析与总结。It is very important to evaluate the effectiveness of the software process in order to improve the software capability maturity level. Orthogonal Defect Classification（ODC） technology is a quantitative means of software process measurement. This paper introduces the concept and development of ODC. The framework of ODC and the key concepts about the various defect attributes of ODC are presented. It illustrates how ODC can be used to measure development process and identify the problem in process, some successful application cases and experiences in practice of ODC are analyzed and summarized.

关 键 词：正交缺陷分类 软件过程度量 缺陷类型 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]