条宽对半导体激光器理想因子测量结果的影响  

Effect of Strip-width on the Measured Ideality Factor of Laser Diode

作　　者：张振国[1] 郭树旭[1] 张爽[1] 任瑞治[1] 

机构地区：[1]吉林大学电子科学与工程学院,长春130012

出　　处：《吉林大学学报（理学版）》2009年第6期1291-1294,共4页Journal of Jilin University:Science Edition

基　　金：国家自然科学基金(批准号:60471009);吉林省科技发展计划重大项目基金(批准号:200403001-4)

摘　　要：利用ORCAD计算机辅助电路分析软件分别对窄条和宽条激光二极管(LD)的理想因子进行仿真.仿真和实验结果均表明,侧向电流扩展导致窄条LD的实测理想因子较大,而宽条LD电流限制能力的改善导致实测理想因子较小,且更接近于本征理想因子值.Ideality factor is closely correlated with the reliability of laser diode（LD）.The measured ideality factor of narrow-strip LD（2~3） is larger than that of wide-strip LD（1-2）.In consideration of the structural difference between wide-strip and narrow-strip LDs,the simulation based on ORCAD was employed on the two types of LDs.The simulated and experimental results indicate that the current expansion is an important factor to affect measured ideality factor.The higher the ability to limit current in active region is, the lower themeasured ideality factor is.

关 键 词：激光器二极管 可靠性 理想因子 电导数 

分 类 号：TN365[电子电信—物理电子学]