缺陷大小的红外热成像检测  

Detection of the Defect Size by Infrared Thermography

作　　者：杨如意[1] 田裕鹏[1] 梁斌 

机构地区：[1]南京航空航天大学自动化学院测试工程系,南京210016 [2]南京市锅炉压力容器检验研究院,南京210001

出　　处：《无损检测》2009年第12期984-987,共4页Nondestructive Testing

摘　　要：采用红外方法检测试件的缺陷,对获得的红外热像图用不同的图像处理方法进行处理,提取出试件的缺陷面积大小,然后对不同方法的检测结果进行评定。试验结果表明,最佳检测缺陷面积大小的时间是在最大对比度图像到后半最大对比度图像附近。随着缺陷深度的增加,同直径试件的缺陷面积也随之增大。其中半最大对比度宽度方法最接近实际缺陷面积大小。在此基础上改变阈值的选取方法,进一步提高了缺陷面积大小的检测精度。The defect size of sample was obtained by different image processing of infrared image method, and the different test reaults were evaluated. Results showed that the best time of detection defect size was at around the half greatest contrast image immediately following the greatest contrast image. With the increase of defect depth, the defect size in same diameter sample was increased. On the basis of this method, the optimization precision of defect size by changing selection method of threshold value can be obtained.

关 键 词：缺陷大小 图像处理 热图像 红外检测 

分 类 号：TG115.28[金属学及工艺—物理冶金]