Complex amplitude reconstruction and phase aberrations compensation in phase-shifting in-line image digital holographic microscopy  被引量:1

Complex amplitude reconstruction and phase aberrations compensation in phase-shifting in-line image digital holographic microscopy

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作  者:马志俭 李红燕 吕晓旭 

机构地区:[1]School of Information and Opto-Electronic Science and Engineering, South China Normal University

出  处:《Chinese Optics Letters》2009年第12期1076-1078,共3页中国光学快报(英文版)

基  金:supported by the National Nature Sci-ence Foundation of China under Grant Nos 60877070and 60747001

摘  要:When an image digital holographic microscopy (DHM) layout is employed, the Fresnel integral cannot be used in separating the reconstructed image from its conjugate image and background. However, combining image plane DHM with the phase-shifting in-line technique, the complex amplitude of reconstructed image can be obtained without using Fresnel integral, moreover the approximate error of reconstruction calculation is easily eliminated and the signal-to-noise ratio of reconstructed image is significantly improved. Since a normal incidence plane wave is used as the reference wave, the difficulty and complexity of phase aberration and phase unwrapping of DHM are remarkably decreased.When an image digital holographic microscopy (DHM) layout is employed, the Fresnel integral cannot be used in separating the reconstructed image from its conjugate image and background. However, combining image plane DHM with the phase-shifting in-line technique, the complex amplitude of reconstructed image can be obtained without using Fresnel integral, moreover the approximate error of reconstruction calculation is easily eliminated and the signal-to-noise ratio of reconstructed image is significantly improved. Since a normal incidence plane wave is used as the reference wave, the difficulty and complexity of phase aberration and phase unwrapping of DHM are remarkably decreased.

关 键 词:ABERRATIONS Amplitude modulation Geometrical optics Phase measurement Signal to noise ratio 

分 类 号:O438.1[机械工程—光学工程]

 

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