强激光辐照硅光电探测器的损伤判别研究  

Study on determine damage of photoelectric detector irradiated by high power laser

作　　者：徐立君[1] 张喜和[1] 蔡红星[1] 李昌立[1] 谭勇[1] 刘丽炜[1] 毕娟[1] 

机构地区：[1]长春理工大学理学院,吉林长春130022

出　　处：《激光与红外》2009年第12期1263-1266,共4页Laser & Infrared

摘　　要：光电探测器的激光损伤阈值是激光与物质相互作用的一个重要研究内容。论文在概述激光诱导光学元件损伤判断方法的基础上,研究了强激光辐照下,探测器响应度变化与被损伤程度的关系,提出了根据响应度变化判断探测器损伤程度的观点,实验研究证实了这种方法的合理性和可行性。Damage threshold laser-induced of photoelectric detector is an important research content for the laser and the material interaction. In this paper,the method for the determining laser-induced damage to optical components was briefly reviewed, and the relationship between the responsivity of detector and the power density of incident laser was obtained through experiments. The viewpoint that the damage degree of detector laser-induced was determined according to the responsivity change was put forward, experiment research confirms that this method is reasonable and probable.

关 键 词：损伤阈值 判别方法 响应度 实时监测 

分 类 号：TN241[电子电信—物理电子学]