SPC在软件过程度量中的应用及改进  

Application and Improvement of Statistical Process Control in Software Process Metrics

作　　者：杜庆峰[1] 马慧珺[1] 

机构地区：[1]同济大学软件学院,上海201804

出　　处：《计算机工程》2009年第24期103-104,107,共3页Computer Engineering

摘　　要：在介绍软件过程度量原理的基础上,讨论Shewhart控制图的构成和分析方法。结合实例,分析统计过程控制在软件过程度量中的作用。针对传统Shewhart控制图无法区分软件过程之间影响的缺陷,借助选控图理论对现有方法在软件过程度量中的不足提出改进。有效区分软件过程的相互作用,定性和定量地分析软件过程的稳定性和性能。This paper introduces the theory of software process metrics as well as the structure and analyzes method of Shewhart control charts.It discusses the role Statistical Process Control（SPC） plays in software process metrics using an example.As traditional Shewhart control charts can not distinguish the causes from other processes,an improvement is proposed with the help of select cause control charts,which can conquer the deficiencies in the field of software process metrics.It can analyze the stability and performance characteristics of software process both qualitatively and quantitatively.

关 键 词：软件过程度量 统计过程控制 选控图 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]