白光LED的失效机理分析  

Analysis of Failure Mechanisms of White LEDs

作　　者：杨少华[1] 吴福根[2] 张春华[2] 

机构地区：[1]工业和信息化部第五研究所电子元器件可靠性物理及其应用技术国家级重点实验室,广州510610 [2]广东工业大学实验中心,广州510006

出　　处：《半导体光电》2009年第6期857-859,882,共4页Semiconductor Optoelectronics

摘　　要：论述了白光发光二极管(LED)在封装和应用中存在的主要模式和失效机理,并介绍了若干失效分析实例,提出了可靠性保证措施,对于进一步完善白光LED封装技术、提高其寿命和可靠性提供参考。Discussed are the main failure modes and mechanisms of white LEDs during the processes of package and applications. Several cases for analyzing the failures are introduced. Finally, some reliability assurance measures are suggested to improve the lifetime and reliability of white LEDs, which are helpful for further improvement of the packaging technology.

关 键 词：白光LED 失效机理 静电损伤 失效分析 

分 类 号：TN312.8[电子电信—物理电子学]