Measurement of the remnant magnetic-field in Lorentz mode using permalloy  

作　　者：Haihua LIU Xiaokun DUAN Renchao CHE Zhifeng WANG Xiaofeng DUAN 

机构地区：[1]Beijing Laboratory of Electron Microscopy, Beijing National Laboratory for Condensed Matter Physics,Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China [2]Advanced Technology ＆ Materials Co., Ltd., Beijing 100081, China

出　　处：《Acta Metallurgica Sinica(English Letters)》2009年第6期435-439,共5页金属学报（英文版）

基　　金：supported by National Natural Science Foundation of China(No.10776037)

摘　　要：A novel method was reported to measure the remnant magnetic field in Lorentz mode in a FEI Tecnai F20 transmission electron microscope equipped with a Lorentz lens. The movement of the circle Bloch line of the cross-tie wall in Permalloy is used to measure the remnant magnetic field by tilting the specimen and adjusting the objective lens current. The remnant magnetic field is estimated to be about 17 Oe, in a direction opposite to that of the objective lens magnetic field. The remnant magnetic field can be compensated by adjusting the value of the objective lens current.A novel method was reported to measure the remnant magnetic field in Lorentz mode in a FEI Tecnai F20 transmission electron microscope equipped with a Lorentz lens. The movement of the circle Bloch line of the cross-tie wall in Permalloy is used to measure the remnant magnetic field by tilting the specimen and adjusting the objective lens current. The remnant magnetic field is estimated to be about 17 Oe, in a direction opposite to that of the objective lens magnetic field. The remnant magnetic field can be compensated by adjusting the value of the objective lens current.

关 键 词：Lorentz electron microscopy Lorentz lens Remnant magneticfield PERMALLOY Cross-tie walls 

分 类 号：O441[理学—电磁学] P631.813[理学—物理]