电子设备自动测试系统的环绕BIT设计  

Design of the BIT for the automatic test system of electronic equipments

作　　者：胡彭炜[1] 杨福兴[1] 何玉珠[2] 

机构地区：[1]北京邮电大学自动化学院,北京100876 [2]北京航空航天大学仪器科学与光电工程学院,北京100191

出　　处：《电子测量技术》2009年第12期137-139,143,共4页Electronic Measurement Technology

摘　　要：介绍了环绕BIT设计原理,结合某型自动测试系统的结构特点,针对系统不同组成模块(通讯、AD、DA、DI、DO等)采取不同的环绕BIT设计处理方式,并采用流程解析的方法来简化BIT流程设计,实现了系统的机内检测。实验表明,设计满足该自动测试系统自检和故障隔离的需要,提高了测试效率,提供了可靠的维修策略和依据。This paper introduces the circle built-in test （BIT） design theory for electronic equipments. According to the structure characteristics of a certain automatic test system, different processing methods were adopted for different modules, such as communication modules, AD, DA, DI, DO, etc. The method of procedures interpreter is implemented to simplify the design of the BIT procedures. The experiment shows that the BIT designed can meet rationally the requirement of self-testing and fault isolation of the automatic test system. It improves the test efficiency and gives the maintenance strategy and foundation in the testing progress.

关 键 词：环绕BIT 自动测试系统 PCI总线 

分 类 号：TP206[自动化与计算机技术—检测技术与自动化装置]