In_2O_3/SnO_2薄膜的制备及光谱反射性能研究  

Fabrication and spectral reflective properties of In_2O_3/SnO_2 film

作　　者：田启祥[1,2] 刘胜超 

机构地区：[1]解放军理工大学,南京210007 [2]总装工程兵科研一所,无锡214035 [3]上海炬通实业有限公司

出　　处：《物理学报》2010年第1期541-544,共4页Acta Physica Sinica

基　　金：国防预研究基金(批准号:ZLY2008415 )资助的课题~~

摘　　要：开展了在伪装网基布上镀In2O3/SnO2薄膜的性能研究,系统分析了薄膜厚度对其光谱反射性能的影响;总结了薄膜厚度对In2O3/SnO2薄膜表面形貌、光谱反射辐射性能的影响规律,为In2O3/SnO2薄膜的红外伪装应用奠定了基础理论和实验依据.In this paper, In2O3/SnO2 thin films deposited on the fabric for camouflage net are developed. Effect of the film thickness on the spectral reflective properties is investigated thoroughly. Results of the influence of the film thickness on the morphology and spectral properties are presented. Application of In2O3/SnO2 film in the infrared camouflage field is proposed.

关 键 词：In2O3/SnO2薄膜 红外反射特性 红外发射率 可见光-近红外透过率 

分 类 号：O484[理学—固体物理]