基于二叉树满足MC/DC测试用例设计方法  

Fit MC/DC for test case generation method based on binary tree

作　　者：张宇[1] 张波[2] 王俊杰[2] 陈媛[2] 

机构地区：[1]同济大学,上海200092 [2]中国科学院长春光学精密机械与物理研究所,长春130033

出　　处：《微计算机信息》2010年第3期171-173,共3页Control & Automation

摘　　要：软件测试是保证软件质量的有效方法,但测试工作过程繁琐,工作量较多。探索高效、可靠的测试用例设计方法一直是大家追求的目标,随着航空航天产品逻辑复杂性的提高及软件规模的日益增大,这种要求也变得更加迫切。依据MC/DC设计的测试用例既提高了测试用例设计的效率又增加了测试覆盖率,比较适合测试逻辑关系相对复杂的软件。当前的很多软件测试工具提供了软件测试覆盖率的判定功能,可以评定设计出的测试用例是否满足MC/DC的要求,而软件测试人员需要的是逆向的过程,论文提出应用唯一原因法和屏蔽法原理设计测试用例,可达到根据逻辑关系自动生成满足MC/DC要求测试用例的目的,提高了测试用例设计的效率。Software testing is an effective way to ensure software quality,but the process of testing is tedious and workload more. To explore efficient and reliable test case design approach is our goal has always been. As the logic complexity of aerospace products and the size of its software increased gradually. It need to improve the efficiency of test case design. Based on MC/DC the test cases is designed,it is not only improve the efficiency of test case design but also added to the test coverage. All that are more suitable for testing relatively complex logic software. Many of the current software testing tools have the ability to determine coverage of the test cases. It can assess whether the design of the test cases satisfy the MC/DC requirements. But the software testers need is the reverse thinking process. The paper presents the application of unique cause and masking principle design test cases. This method automatically generates test cases which satisfy the MC/DC requirements. This approach improves the efficiency of the design of the test case.

关 键 词：软件测试 MC/DC 二叉树 唯一原因法 屏蔽法 

分 类 号：TP311.5[自动化与计算机技术—计算机软件与理论]