天线反射对混波室场均匀性校准的影响  

Influences of Antenna Reflection on the Field Uniformity Calibration of Reverberation Chamber

作　　者：周香[1] 蒋全兴[1] 何鹏[1] 

机构地区：[1]东南大学电磁兼容实验室,江苏南京211189

出　　处：《测控技术》2010年第1期100-102,共3页Measurement & Control Technology

基　　金：国家自然科学基金资助项目(50607001)

摘　　要：场均匀性是混波室的重要指标,但其在校准中会受天线反射的影响。首先计算分析了混波室经验最低使用频率与体积的关系,通过增加体积降低最低使用频率会增加成本;然后介绍了混波室场均匀性校准程序,最后通过实验分析得出,混波室搅拌器搅动会影响发射天线驻波比,由此导致归一化因子不同混波室场强归一化标准偏差不同,甚至会影响混波室最低使用频率。Field uniformity is the important property index of reverberation chambers （ RC）, and its calibration is influenced by antenna reflection, The relation between experiential lowest useable frequency （LUF） of RC and its volume is analyzed. To decrease the LUF, the cost will increase by increasing the volume. Then, the procedure of field uniformity calibration of RC is introduced. At last, it is concluded that the stirring of RC stirrer affects the voltage standing wave ration （VSWR） antenna through experiment, which results in that the normalized standard deviation of field strength varies with the normalizing factor, even that the LUF is influenced.

关 键 词：天线反射 混波室 场均匀性 最低使用频率 

分 类 号：TB973[一般工业技术—计量学]