竞争失效产品定时截尾的简单恒加寿命试验的优化设计  

Optimum Simple Constant-Stress Accelerated Life Tests with Competing Causes of Failure

作　　者：刘立喜[1] 葛广平[2] 

机构地区：[1]上海财经大学统计系,上海200083 [2]上海大学理学院数学系,上海200072

出　　处：《应用概率统计》1998年第3期301-306,共6页Chinese Journal of Applied Probability and Statistics

基　　金：国家自然科学基金

摘　　要：本文在指数分布场合下研究了具有竞争失效机理产品的简单恒加试验的优化设计问题,得出了一系列与简单步加试验相对应的结果．这里最优性是指正常应力水平下各失效机理的对数平均寿命的极大似然估计（MLE）的渐进方差之和的极小化．This paper presents optimum plans of simple constant-stress accelerated life tests with com peting causes of failure which life distribution of each failure cause is assumed to be exponential.We obtain the optimum test design to minimize the sum of asyniptotie vaeiance of the Maximum Likelihood Estimation (MLE) of the mean life in each cause at a design stress.A series of mter esting results are shown,which are similar to or identical with those results shown in a lot of other papers

关 键 词：简单恒加试验 竞争失效机理 寿命试验 优化设计 

分 类 号：O213.2[理学—概率论与数理统计]