AFM针尖-测试面接触分子动力学研究(英文)  

Molecular Dynamics Simulation of Contact Force Between Sample and AFM Tip

作　　者：田文超[1] 陈贵敏[1] 刘焕玲[1] 

机构地区：[1]西安电子科技大学机电工程学院,陕西西安710071

出　　处：《计算物理》2010年第1期150-156,共7页Chinese Journal of Computational Physics

基　　金：National Natural Science Foundation of China(10476019);Xi'an Applied Materials Innovation Fund Application(XA-AM-200802)

摘　　要：针对AFM针尖-测试面的接触问题,利用分子动力学模拟针尖同测试面间的"跳跃粘附"和"颈缩分离"过程;分析接触力同接触间隙的关系及测试面压力分布;发现分离过程滞后粘附过程;得到接触力大小只与接触区域附近少数原子层有关,且接触区域近处原子受压力、远处受拉力的结论;讨论测试面位错半径同接触力和接触间隙的关系.Contact between tip of atomic force microscope（AFM） and tested sample surface is simulated using molecular dynamics （MD）. Relationship between contact force and gap is analyzed. Surface pressure distribution is discussed. Phenomena of ＂jump-to-contact＂ and ＂neck-separation＂ are observed. Hysteresis between contact process and separate process is obtained. Relationship of surface distortion radius with contact force and gap is also discussed. Only atomic layer close to contact area affects the contact force. Surface atoms close to the contact are pressed and those far from the contact are oulled.

关 键 词：分子动力学 粘附 分离 原子力显微镜 

分 类 号：O411.3[理学—理论物理]