密封式电磁继电器步进应力加速寿命试验的分析方法  

Analysis Approach for Step-Stress Accelerated Life Test of Sealed Electromagnetic Relays

作　　者：李凌[1] 徐伟[1] 

机构地区：[1]西北工业大学应用数学系,陕西西安710072

出　　处：《低压电器》2010年第1期5-7,16,共4页Low Voltage Apparatus

基　　金：国家自然科学基金项目资助(10472091)

摘　　要：根据步进应力加速寿命试验原理,提出了一种快速评价密封式电磁继电器贮存寿命的试验方法。在定数截尾场合下,建立寿命分布服从威布尔分布的继电器步进应力加速寿命试验模型,采用似然方法计算出继电器在正常应力水平下的寿命特征。结合部件寿命信息给出Newton-Raphson迭代公式的初始值确定方法,为预测继电器贮存寿命提供了依据。利用随机模拟方法举例,验证了所提理论的正确性和有效性。Based on principle of step-stress accelerated life test, a test method to estimate the storage life of sealed electromagnetic relays was proposed. A step-stress accelerated life test model of relays for Weibull distribution was considered under fixed time. The lifetime was estimated by using the maximum likelihood estimates in norreal stress level. The basis of relays storage life was provided based on confirmation method for Newton-Raphson formular initial value. Some numerical results were discussed to illustrate validity of this model.

关 键 词：加速寿命试验 电磁继电器 威布尔分布 贮存寿命 

分 类 号：TM581[电气工程—电器]