新型电化学原子力显微镜的研制  

Development of a novel electrochemical atomic force microscope

作　　者：孙晓凤[1] 惠飞[1] 何品刚[1] 方禹之[1] 

机构地区：[1]华东师范大学化学系,上海200062

出　　处：《分析仪器》2010年第1期24-27,共4页Analytical Instrumentation

基　　金：上海市科学技术委员会科研计划项目(061422007)

摘　　要：电化学原子力显微镜将电化学分析技术与原子力显微镜结合起来,能对生物传感器,新型电池和电腐蚀进行原位电化学扫描探针显微测量分析。为了实现电化学与扫描探针功能的系统集成,在控制电路设计中采用现场可编程门阵列,提高了系统的可靠性。电化学控制箱与原子力显微镜的头部紧密集成,保证微弱信号不受干扰,并具有多种电化学工作模式。系统具有稳定性好,重复性高,抗干扰能力强等优点。Electrochemical atomic force microscope （EC-AFM） is an analytical instrument that combines electrochemical analysis with atomic force microscope. It can perform in-situ electrochemical scanning probe micro analysis for scientific researches on biosensors, new types of batteries, electrochemical corrosion, and so on. In order to integrate the electrochemical scannng with AFM functions, the field programmable gate array （FPGA） is chosen in the design of control circuit to increase the reliability of the system. The electrochemical workstation is closely integrated with the head of AFM to ensure that the weak signal is not interfered, and it has a variety of electrochemical working modes. The system is stable, and has high repeatability and strong anti-interference capability.

关 键 词：电化学原子力显微镜 恒电位仪 微电流检测 

分 类 号：TH742[机械工程—光学工程]