光栅相移精密控制系统的设计与应用  

Design and Application of a Precision Control System of Grating Phase-shifting

作　　者：吴禄慎[1] 汪炜晨[1] 

机构地区：[1]南昌大学机电工程学院,江西南昌330031

出　　处：《南昌大学学报（工科版）》2009年第4期339-343,共5页Journal of Nanchang University(Engineering & Technology)

基　　金：国家自然科学基金资助项目(59965003);江西省教育厅科技资助项目

摘　　要：投影栅相位法是三维轮廓测量的热点方法之一,主要用于测量物体表面三维形貌和离面变形位移场等。根据投影栅相位法三维测量原理,提出了一种实现光栅相移精密控制的方法,详细阐述了整个装置实现控制的过程。通过对实际物体的测量,证明了该方法的有效性。将实验结果用于三维图像的重构,得出的物体三维图像表明:此种方法可以完好地实现投影栅相位法对物体的测量,其测量数据准确、测量过程可靠,并且大大提高了投影栅相位法的测量效率。Projected grating is one of the hot methods of three-dimensional profile measurements.It is primarily used to measure the three-dimensional shape of object surface and the displacement field of deformations away from object surfaces.A method is proposed to achieve precision control of grating phase-shifting and the process to achieve control of the whole system for details is elaborated,based on the theory of projected grating three-dimensional measurements.This method is proved effectively by the dimension of a physical object.When the result is used to reconstruct the three-dimensional graphics,it is found that this method can perfectly achieve the dimension of objects with precise data and reliable process by projected grating and increase the efficiency of projected grating.

关 键 词：三维测量 光栅相移 细分 

分 类 号：TH741[机械工程—光学工程]