基于ODC的软件缺陷度量研究  

Software defect metric based on orthogonal defect classification

作　　者：陈爱真[1] 曾福萍[1] 陆民燕[1] 

机构地区：[1]北京航空航天大学工程系统工程系,北京100191

出　　处：《计算机应用研究》2010年第2期563-565,共3页Application Research of Computers

摘　　要：从正交缺陷分类(orthogonal defect classification,ODC)出发,介绍在缺陷度量前需要收集的缺陷数据信息,阐述了缺陷属性的具体分类,然后从单维度和多维度两个角度介绍了如何利用ODC的缺陷属性进行度量分析,并给出了软件组织应用ODC的流程,最后提供了正交缺陷分类方法的应用实例,为缺陷度量的应用研究提供了一种思路。Firstly, according to the orthogonal defect classification, this paper described the defect data information which should be collected before defect measurement execution. Secondly, it described how to use the orthogonal defect classification for measurement analysis from the views of single dimension and multi-dimensional. Thirdly, presented the application process in the software organization. Finally, elaborated the application example. The study of this paper offered a new thought to the application of defect measurement.

关 键 词：软件度量 缺陷度量 正交缺陷分类 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]