用电阻应变片测量应力强度因子方法的研究  

A METHOD FOR MEASURING MODE I STRESS INTENSITY FACTOR WITH STRAIN GAGES

作　　者：杨韶明[1,2] 李树欣[1,2] 

机构地区：[1]合肥工业大学 [2]中国科学技术大学

出　　处：《实验力学》1998年第3期388-392,共5页Journal of Experimental Mechanics

摘　　要：本文利用Ｗｉｌｉａｍｓ应力函数导出的应变场渐进表达式和电阻应变片测量技术，测量张开型（Ｉ型）裂纹尖端附近两点应变来确定应力强度因子ＫＩ。通过对不同裂纹体的测试结果表明，该技术具有较好的适用性。A method for measuring the opening mode stress intensity factor K I with two strain gages is investigated, where the equation used for calculating the value of K I is derived from Williams stress asymptotic expansion. Comparison between the results obtained by the method and some known references shows that the method is feasible and may be applied to crack bodies with irregular geometry and complex loadings.

关 键 词：应力强度因子 电阻应变片 断裂力学 

分 类 号：O346.1[理学—固体力学] O346.4[理学—力学]