混合探针组分对光固化材料表面性能的影响  

Effect of the mixed probe components on the surface properties of the UV cured materials

作　　者：骆燕[1] 王德海[1] 霍超[1] 杨霞珍[1] 

机构地区：[1]浙江工业大学化学工程与材料学院,杭州310014

出　　处：《辐射研究与辐射工艺学报》2010年第1期11-14,共4页Journal of Radiation Research and Radiation Processing

基　　金：浙江省自然科学基金(No.Z503236);浙江工业大学校基金(No.0901101002408)资助

摘　　要：本文利用X射线光电子能谱(XPS),在空气和氮气氛围下,分别考察了探针组分BYK-307(聚醚改性聚二甲基硅氧烷共聚体)、EFKA-3772(氟碳改性聚丙烯酸)、BYK-307+EFKA-3772对丙烯酸类光固化膜表面的元素组成、电子结合能以及相对含量的影响。研究结果表明,在同时含有BYK-307和EFKA-3772的材料表面,Si和F的结合能较单一添加BYK-307或EFKA-3772的材料有显著的变化,分别相差0.4eV和2.13eV,表明两种元素所处的化学环境发生了较大变化,导致混合添加探针组分使材料表面能显著降低。此外,材料表面的Si元素含量较高,而F元素含量很少甚至探测不到,说明紫外光固化过程中,含Si元素的链段更易向材料表面迁移。The photosensitivity resins which contain BYK-307, EFKA-3772, and BYK-307＋EFKA- 3772 respectively were UV cured under different atmospheres （air and N2）. The surface properties of the cured films were characterized by means of surface energy measurement and X-ray photoelectron spectroscopy. The results show that the surface energy of the films with mixed probe components drops obviously, also the bonding energy of Si and F are changed obviously, and the difference is 0.4 eV and 2.13 eV, respectively. It indicates that the chemical environment can transform the result in the different surface energy of the films. Furthermore, the content of Si is high, whereas the content of F is especially low and even can＇t be detected, which shows that it is easier for the segment with Si to migrate to the surface during the curing process.

关 键 词：表面能 X射线光电子能谱 结合能 原子浓度 

分 类 号：TQ314.24[化学工程—高聚物工业] TB303[一般工业技术—材料科学与工程]