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作 者:管志强 罗刚 MONTELIUS Lars 徐红星
机构地区:[1]Nanoscale Physics and Devices Laboratory, Institute of Physics, Chinese Academy of Sciences, Beijing 100190 [2]Division of Solid State Physics/The Nanometer Structure Consortium, Lund University, Lund S-221 00, Sweden
出 处:《Chinese Physics Letters》2010年第2期307-310,共4页中国物理快报(英文版)
摘 要:Bending and first flexural mode vibration behavior of electrostatic actuated nanometer-sized interdigitated cantilever arrays are characterized under vacuum conditions. The pull-in'' effect in dc driving and the hard spring effect'' in ac driving are observed. A mass sensitivity of 20 fg is expected for our devices due to the ultra-small mass of the arm and relative high Q factor. The mass-spring lump model combined with Green's function method is used to fit the dc driving behaviors including the pull-in voltage. For the ac driving case, the polynomial expansion of the capacitive force is used in the model. The successfully fittings of the pull-in voltage and the hard spring effect prove that our simulation method could be used for guiding the geometrical design of cantilever-based sensors.Bending and first flexural mode vibration behavior of electrostatic actuated nanometer-sized interdigitated cantilever arrays are characterized under vacuum conditions. The pull-in'' effect in dc driving and the hard spring effect'' in ac driving are observed. A mass sensitivity of 20 fg is expected for our devices due to the ultra-small mass of the arm and relative high Q factor. The mass-spring lump model combined with Green's function method is used to fit the dc driving behaviors including the pull-in voltage. For the ac driving case, the polynomial expansion of the capacitive force is used in the model. The successfully fittings of the pull-in voltage and the hard spring effect prove that our simulation method could be used for guiding the geometrical design of cantilever-based sensors.
关 键 词:Electronics and devices Instrumentation and measurement Condensed matter: structural mechanical & thermal Nanoscale science and low-D systems
分 类 号:TP271.9[自动化与计算机技术—检测技术与自动化装置] U471.1[自动化与计算机技术—控制科学与工程]
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