迈克尔逊干涉仪测波长实验中常见问题分析  

Analysis of Few Problems in the Experiment of Measuring the Wave Length with Michelson Interferometer

作　　者：刘建静[1] 

机构地区：[1]天津科技大学理学院,天津300222

出　　处：《实验科学与技术》2010年第1期31-32,共2页Experiment Science and Technology

摘　　要：分析了迈克尔逊干涉仪测波长实验中干涉条纹的调整,计数条纹和测量d值及仪器松动磨损等常见的几个问题,并对其产生原因进行了探讨,对提高学生的实验效率有所帮助。This paper analyses some common problems in the experiment of measuring wave length with Michelson interferometer. These problems include adjustment of interference striation, counting fringe, measuring d value and loose and abrasion of instrument, etc. One discusses the reasons for producing the problems, which is useful for improving the experiment efficiency of students.

关 键 词：迈克尔逊干涉仪 等倾干涉 干涉条纹 

分 类 号：O436.1[机械工程—光学工程] G642.0[理学—光学]