降感环三甲撑三硝胺微缺陷小角X射线散射研究  

Microstructure analysis of D-RDX by small angle X-ray scattering

作　　者：闫冠云[1] 黄朝强[1] 夏庆中[1] 陈波[1] 黄明[2] 聂福德[2] 吴忠华[3] 

机构地区：[1]中国工程物理研究院核物理与化学研究所,绵阳621900 [2]中国工程物理研究院化工材料研究所,绵阳621900 [3]中国科学院高能物理研究所,北京100049

出　　处：《核技术》2010年第3期161-164,共4页Nuclear Techniques

摘　　要：应用小角X射线散射研究含能材料降感RDX微缺陷结构,给出降感RDX样品材料内部微缺陷尺寸及微缺陷数量信息,分析了降感RDX晶体在生长过程中微缺陷变化趋势。结果表明,降感RDX微缺陷数量密度随晶体粒度增加逐渐降低,微缺陷特征尺度变化较小,另外还存在部分择优取向分布特征的微缺陷,微缺陷密度呈降低趋势。The micro-defects of D-RDX were analyzed by small angle X-ray scattering （SAXS）. Scale and density of micro-defects in the D-RDX of different the qualities during the crystal growing were investigated. The results show that the larger D-RDX crystals have less micro-defect density and better crystal quality. Micro-defects with orientated distributions in the D-RDX indicated anisotropic microstructure in D-RDX.

关 键 词：小角X射线散射 降感RDX 微缺陷 

分 类 号：O722.5[理学—晶体学]