恒电位阳极氧化对锆合金表面钝化膜的影响  

INFLUENCE OF VOLTAGES ON PASSIVE FILMS OF ZIRCONIUM ALLOYS BY CONSTANT VOLTAGE ANODIC OXIDATION

作　　者：钟祥玉[1] 李谋成[1] 姚美意[1] 沈嘉年[1] 

机构地区：[1]上海大学材料研究所,上海200072

出　　处：《上海金属》2010年第1期34-38,共5页Shanghai Metals

基　　金：武器装备预研基金项目(9140C700401803)

摘　　要：采用动电位扫描极化曲线、电化学阻抗谱、Mott-Schottky曲线等电化学测试方法,研究了在室温0.1 M Na_2SO_4溶液条件下,不同极化电位对锆合金钝化膜性能的影响。结果表明,锆合金表面钝化膜表现出n型半导体性质,随着极化电位的增加,锆合金钝化膜缺陷密度下降,半导体性质减弱,阻抗值增大。阻抗谱可以用RQ并联后与溶液电阻Rs串联的等效电路来拟合。在相同的极化电位下,含Nb的N18合金表面钝化膜的缺陷密度要小于出厂退火态Zr-4合金。The influence of voltages on anodic films of Zr alloy by constant voltage anodic oxidation at ambient temperature in 0.1M Na2SO4 solution was studied by means of polarization curve, electrochemical impedance spectroscopy （EIS）, Mott -Schottky measurement. The experimental results revealed that the voltages exhibited a strong influence on the corrosion of zirconium alloy. The passive films formed on Zr showed n -type semiconductor property and the donor density decreased with the voltage elevating, but the impedance increased with the voltage elevating. The data suggested that the film could be modeled adequately by a parallel RQ combination, with an additional series corresponding to the solutions resistance. The donor density of the passive film on N18 alloy was lower than as received in Zr- 4 alloy when polarized at the same potential.

关 键 词：锆合金 钝化膜 电化学阻抗谱 阳极极化 

分 类 号：TG146.414[一般工业技术—材料科学与工程] TQ174.758[金属学及工艺—金属材料]