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作 者:张殿凯[1] 郑永章[1] 臧慕文[1] 刘英[1] 童坚[1]
出 处:《分析试验室》2010年第3期30-33,共4页Chinese Journal of Analysis Laboratory
基 金:国家科技支撑计划(2006BAF07B02)项目资助
摘 要:研究了氢化物发生-原子荧光光谱法测定高纯铟中微量As、Sb元素的条件,选择了适宜的反应条件以及仪器的最佳工作条件,考察了铟基体对被测元素的干扰,采用基体匹配的方法消除干扰,建立了氢化物发生-原子荧光光谱法测定高纯铟中微量的As、Sb的分析方法。As、Sb的检出限分别为0.18和0.28 ng/mL,测定下限为1.2×10-5和1.9×10-5,相对标准偏差分别为1.9%和1.7%,回收率为97.4%和103%,适用于5~6 N高纯铟中微量As、Sb的测定。A method for the determination of arsenic and antimony in high purity indium by hydride generation atomic fluorescence spectrometry(HG-AFS) has been proposed.The optimum experimental parameters,the effect of coexistent elements on the determination of arsenic and antimony,the accuracy and precision of the method were investigated.The detection limits of As and Sb were 0.18 ng/mL and 0.28 ng/mL.The determination limits of As and Sb were 1.2×10-5 and 1.9×10-5.The recoveries were 97.4%~103% and the RSDs(n=5) of As and Sb were 1.9% and 1.7%.The method can be applied to analysis of the trace arsenic and antimony in high purity indium.
关 键 词:AS SB 氢化物发生-原子荧光光谱法 高纯铟
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