相位物体相位测量系统  

PHASE-MEASURING SYSTEM OF PHASE-OBJECT

作　　者：黄妙娜[1,2] 黄佐华[1] 

机构地区：[1]华南师范大学物理与电信工程学院,广东广州510631 [2]华立科技职业学院,广东广州511325

出　　处：《华南师范大学学报（自然科学版）》2010年第1期42-46,共5页Journal of South China Normal University(Natural Science Edition)

摘　　要：组建了一种实用的测量相位物体相位的系统,主要介绍其系统结构、基于LabView平台的硬件组件的连接、软件部分的图像处理算法的设计,并将其应用于位相光栅相位的定量检测.实验结果表明:该测量系统结构简单、重复性好、稳定性高、数据采集自动化,能较好地再现位相光栅的结构,并得到相位光栅相位分布假彩色图、灰度图及三维分布图.对相位物体的相位以及其它光学参数如厚度、折射率的测量具有一定的应用价值.A practical phase-measuring system for phase-object is proposed,including its configuration,the connection of the hardwares which is based on the LabView platform and the image-processing algorithm,which is also applied in the phase grating phase-measuring quantitatively.The results showed that this measuring system is simple,reliable,data acquisition automately and easily repeated.In the phase measurement of the phase-object and the alignment of other optical parameters such as thickness,the refractive index measurement has certain practical significance.

关 键 词：相位测量系统 扫描平移台 CMOS LABVIEW 图像处理算法 位相光栅 

分 类 号：O438[机械工程—光学工程]