太赫兹脉冲计量技术  

Terahertz Pulse Metrology Technology

作　　者：马喆 马红梅 龚鹏伟 杨春涛 

机构地区：[1]北京无线电计量测试研究所 [2]计量与校准技术国防重点实验室,北京100039

出　　处：《宇航计测技术》2010年第1期24-27,共4页Journal of Astronautic Metrology and Measurement

摘　　要：太赫兹(以下简称THz)波位于微波到红外光学的过渡区域,具有重要的学术价值,在民用和国防等领域有着广泛的应用。高速器件产生或传输的超快脉冲宽度已达皮秒量级,带宽已进入太赫兹频段。传统技术和方法无法解决此类器件的校准问题,而结合光电技术的时域电光取样(EOS)技术则为太赫兹脉冲计量提供了有效的手段,本文对此类新技术进行了全面的概述。Between microwave and infrared optics, terahertz wave has important academic values and broad applications in the domain of civilian technology and national defense. High-speed equipments and devices can generate and transfer ultra-fast pulses with their width in picosecond magnitude, and the broad width of these pulses reaches terahertz frequency. Traditional techniques and methods can not solve the calibration problems of these devices. Combining with optoelectronics,time domain electro-optic sampling（EOS） technology supplies effective method for the terahertz pulses metrology, and these advanced technologies are generally summarized in this paper.

关 键 词：太赫兹脉冲 电光取样 取样示波器 光电探测器 脉冲产生器 

分 类 号：TB973[一般工业技术—计量学]