基于CMOS图像光栅传感器的位移测量系统的实现  

The Design of Displacement Measurement System Based on CMOS Image Sensors in Grating Sensors

作　　者：杨军平[1] 吴欣慧[1] 秦长海[1] 

机构地区：[1]安阳工学院电子信息与电气工程系,河南安阳455000

出　　处：《科技信息》2010年第5期98-99,共2页Science & Technology Information

摘　　要：目前在科技研究、工业生产等各行业中,对于位移的高精度测量都是不可或缺的。利用光栅传感器完成测量是目前的主要方法。光栅传感器利用光电转换的原理将位移转换为电信号,该信号经过整形、细分后输出给后级电路完成对信号的处理,最后得到位移大小方向。本文在分析光栅传感器工作原理的基础上,提出借助CMOS图像传感器代替传统的硅光电池检测莫尔条纹,完成信号的细分,实现对位移的高精度测量。文中介绍了整体电路的设计和单片机系统的硬件及软件流程。The precision measurement of displacement is necessary in scientific research and industry. At present, the main way is by grating sensors. The Geometries of displacement are converted to electric signal by grating sensors through photo-electro conversion. This signal is sent to circuit after shaping and subdivision, the quantity and direction of displacement are acquired at last. Based on the analysis of working principle of grating sensor, this paper gives a new method to detect displacement with high accuracy .It uses CMOS image sensor instead of traditional silicon photocell to detect Moire fringe and subdivide signal. This paper introduced the design of circuit and the hardware and software of Single-Chip Microcomputer system.

关 键 词：CMOS图像传感器 光栅传感器 测量 

分 类 号：TP212[自动化与计算机技术—检测技术与自动化装置]