大功率白光LED寿命试验及失效分析  

Life Test and Failure Mechanism Analyses for High-power White LED

作　　者：赵阿玲[1] 尚守锦[1] 陈建新[1] 

机构地区：[1]北京工业大学电子信息与控制学院,北京100022

出　　处：《照明工程学报》2010年第1期48-52,57,共6页China Illuminating Engineering Journal

基　　金：北京市教委项目(10200650)

摘　　要：为了进行大功率白光LED可靠性研究,对大功率白光LED进行电流应力加速寿命试验,分析研究光通量、发光效率、峰值波长、主波长和电压等参数随老化时间的变化情况,通过对试验出现的结果和失效现象进行分析比较,表明衰变退化的主要原因是荧光粉的退化、封装材料的热退化,以及散热问题导致的退化等。In this paper,current stress accelerated lifetime tests and reliability test are introduced for white LED formed by high-power GaN blue chips and phosphor.Some performance parameters such as lumen flux,luminous efficacy,peak wavelength,the main wavelength and voltage were studied.According to experimental results,the main reasons of slow failure are the blue chip performance degradation and decay phosphor.Some methods to improve the reliability were indicated in paper.

关 键 词：白光LED 老化 失效 

分 类 号：TN312.8[电子电信—物理电子学]