光电子能谱研究锌镀层硫代酰胺彩色配合物膜  

Investigations on the Colored Coordination Compound Films of Several Thiourea Derivatives on Zinc Plate with Photoelectron Spectrometer

作　　者：李道华[1] 

机构地区：[1]内江师范学院,内江641112

出　　处：《表面技术》2010年第2期24-27,共4页Surface Technology

基　　金：四川省应用基础研究计划资助项目(07JY029-007)

摘　　要：用光电子能谱（XPS和AES）研究了配合物膜层的组成、结构和性能，以及在金属表面的成键特征和波谱变化。结果表明，多数硫代酰胺化合物分子中的硫代酰胺基团在参与配位反应时发生了去质子化，N，S均发生了配位，另有部分硫代酰胺基团未去质子化，直接与Zn^2＋。配位。从配合物膜的AES深度剥蚀曲线的组成恒定区求得膜层由Zn，N，C，S和O元素组成，膜层的厚度在60～200nm之间。The photoelectron spectrometer （XPS and AES） determinations were carried out to investigate the formation, structure, function, and the bonding features and spectral changes of the coordination compound films. It shows that during the interface reaction, most thiourea derivatives participated in a coordinated response to be protonated and some undeprotonated participated in Zn^2＋ coordination directly. The films are composed of Zn, N,C,S and O, according to the calculation on the AES depth profile curves. The results of XPS and AES analyses show that the thickness of the film is about 60-200 nm.

关 键 词：锌镀层材料 硫代酰胺 彩色配合物膜 光电子能谱 组成与结构 

分 类 号：O614.81[理学—无机化学]