运算放大器自动测试系统的设计与应用  

Design and Application of Automatic Test System with Operational Amplifiers

作　　者：王鑫[1] 彭楚武[1] 黎福海[1] 余展然[1] 

机构地区：[1]湖南大学电气与信息工程学院,长沙410082

出　　处：《微计算机信息》2010年第11期170-172,共3页Control & Automation

摘　　要：自动测试系统满足现代科研生产中对测试高速度和高精度的要求,其发展方向是标准化、模块化和系列化。介绍了一种针对集成运算放大器的自动测试设备,系统采用辅助放大器测试方法,该方法具有测试精度高,易于建立条件,通用性好,可以完成自动测试等优点。系统可以自动完成量程的切换,无需人工操作,对IC制造厂家及生产线具有很大使用价值。应用结果表明该系统测试速度快,运行稳定可靠。The automatic test system satisfies the requirements of high-speed and high-accuracy in the modern scientific research, whose future direction is in the standardization, modularization and serialization. An automatic test system with integrated operational amplifiers is proposed. The system uses the auxiliary amplifier test method which has a great number of merits, like the high precision, easy to establish the condition, the good generality, automatically completing test process and so on. The system can change the measuring range automatically without manual operation, which is very useful for the IC manufacturers. Its application results indicate that the system runs steadily and reliably in high test speed.

关 键 词：自动测试系统 集成运算放大器 高精度 自动测试 

分 类 号：TP302.1[自动化与计算机技术—计算机系统结构] TN722.77[自动化与计算机技术—计算机科学与技术]