可修复电子部件定量加速寿命试验  

Quantitative Accelerated Life Test of Repairable Electronic Components

作　　者：李金国[1] 马志宏[1] 

机构地区：[1]空军装备研究院雷达所,北京100085

出　　处：《装备环境工程》2010年第2期9-12,共4页Equipment Environmental Engineering

摘　　要：采用齐次泊松过程(HPP)与失效物理模型相结合的模型,即HPP-Arrhenius综合模型,探讨了可修电子部件定量加速寿命试验方法。该方法充分利用了可靠性预计数据建模,并通过定时截尾试验方案来验证评估该综合模型的适用性。结果表明,该模型和方法不仅在试验数据处理方面比传统的Arrhenius模型有更高的精度,而且还可校正失效物理模型中激活能等参数预计值。The HPP-Arrhenius model that combines the HPP method and physical failure model was established. The quantitative accelerated life test method of repairable electronic components was discussed. The method defines the compositive model with estimated parameters and validates its applicability by was validated use of fixed-duration test plans. The results showed that the model and method proposed is not only good at parameter evaluation with high accuracy in comparison with the traditional one, but also can be applied to revise assessment value like Ea for physical failure model.

关 键 词：定量加速寿命试验 齐次泊松过程 综合模型 加速模型 可修复 

分 类 号：TB114.3[理学—概率论与数理统计]