基于LabVIEW的半导体光源P-I特性测试系统  

P-I Characteristics Testing System of Semiconductor Light Source Based on LabVIEW

作　　者：李强[1] 曾显光[1] 张永林[1] 

机构地区：[1]暨南大学光电工程研究所,广东广州510632

出　　处：《光学与光电技术》2010年第2期39-41,共3页Optics & Optoelectronic Technology

摘　　要：采用PCI-6251数据采集卡和LabVIEW平台,设计了一套半导体光源的P-I特性测试系统。该系统通过软件驱动数据采集卡为发光器件提供合适的驱动电压,采集发光器件的光功率和驱动电流,实现了P-I特性曲线的测量、分析和存储等功能。测试结果表明该系统设计成本低、测量效率高、人机界面友好、操作简单、扩展性强,适用于教学、实验及科研等领域。A P-I characteristics testing system of the semiconductor light source with PCI-6251 data acquisition card and the LabVIEW platform is designed. The software drives the data acquisition card to provide a suitable voltage for the semiconductor light source, and acquires the optical power and the driving voltage of the semiconductor light source at the same time. It achieves the measurement, analysis and storage of the PI characteristics curve with low design cost, high measurement efficiency and a friendly human-machine interface. The system is also simple to be operated and expanded. It is suitable for the higher education and scientific research.

关 键 词：虚拟仪器 数据采集 半导体光源 P-I 特性 

分 类 号：TP216[自动化与计算机技术—检测技术与自动化装置]