STM钨针尖的制备  

Preparing tungsten tip of STM

作　　者：牛建龙[1] 吴雪[1] 李枫[1] 左真涛[1] 

机构地区：[1]南开大学物理科学学院,天津300071

出　　处：《物理实验》2010年第4期1-3,7,共4页Physics Experimentation

摘　　要：设计了STM钨针尖制备电路,可实现纳秒级快速断电.采用粗、细腐蚀流程,可以保证针尖低纵横比,同时减少其表面附着的氧化膜杂质.对针尖进行稀盐酸超声清洗,可以彻底去除针尖的氧化层.该针尖经盐酸超声后再进行STM扫描得到了清晰的高序热解石墨图像.STM tungsten tip preparation circuit which can complement nanosecond power switch is presented. Adopting preliminary and delicate corrosion process, the longitudinal to transverse ratio is ensured, and the oxide layer on the tip is reduced. In order to remove the oxide layer, the tip is ultrasonically polished in hydrochloric acid later. Fine images of highly oriented pyrolytic graphite are obtained.

关 键 词：扫描隧道显微镜 钨针尖 电化学腐蚀 快速断电电路 氧化层 

分 类 号：O59[理学—应用物理]