EAST内冷屏降温过程瞬态温度场和热应力分析  

Analysis of transient temperature field and thermal stress of internal thermal shield for EAST during cooling down

作　　者：祝燕云[1] 庄明[1] 王学敏[1] 徐光福[1] 周芷伟[1] 

机构地区：[1]中国科学院等离子体物理所,合肥230031

出　　处：《低温工程》2010年第2期37-41,共5页Cryogenics

摘　　要：基于EAST内冷屏降温过程的安全问题,验证目前50K控制温差的合理性。运用有限元软件ANSYS计算了降温过程中冷氦流在50K进出口温差下内冷屏的温度场和热应力分布,以及总应力的大小,计算结果表明当前的控制参数是合理的。Based on the security of internal thermal shield during cooling down of EAST, the rationality of 50 K temperature difference was verified. The temperature field, thermal stress and total stress were calculated with ANSYS software while flowing gaseous helium was at 50 K temperature difference between import and export during cooling down. The calculated results demonstrate existing control parameters are rational.

关 键 词：EAST 内冷屏 温度场 热应力 ANSYS 

分 类 号：TB652[一般工业技术—制冷工程]