微电极测深系统在石质文物表层劣化检测中的应用研究  

Micro-electrode system development and applied research in the deterioration detection of the surface of stone monument

作　　者：李宏松 翟松涛 肖宽怀[3] 

机构地区：[1]中国文化遗产研究院,北京100029 [2]骄鹏科技(北京)有限公司,北京100029 [3]中铁一院物探研究所,兰州730001

出　　处：《工程勘察》2010年第5期78-83,共6页Geotechnical Investigation & Surveying

基　　金：国家自然基金面上项目资助(40772167)

摘　　要：本文主要介绍了为检测石质文物表层劣化程度而研制开发的微电极高密度电阻率测深成像系统的指标参数及电阻率精细成像的基本原理,并结合物理模型试验结果,在云冈石窟对文物近表面的微构造、风化带、含水程度进行了精细成像测试,测试结果表明,该系统能有效地评价文物近表面的微构造、风化带划分以及含水情况,说明其在文物保护及监测领域具有较高的推广应用价值。This paper introduces micro-electrode high-density resistivity imaging fine principle, the development of test instruments and the survey of the field of heritage conservation applications combined with the physical model test results.The Yungang Grottoes in the heritage of the micro-structure near- surface,weathering zone,the extent of the water-bearing fine imaging test results show that the system can effectively evaluate the artifacts near the surface of micro-structure,weathering zone boundaries and the aquifer,the investigation with the promotion of heritage value.

关 键 词：微电极 高密度电阻率 精细成像 文物保护 

分 类 号：P631.3[天文地球—地质矿产勘探]