基于探针法的FED电极缺陷检测系统设计  

Design of Defect Inspection System for FED Electrodes Based on Probe Method

作　　者：张永爱[1] 张杰[1] 许华安[1] 姚亮[1] 郭太良[1] 

机构地区：[1]福州大学场致发射显示技术教育部工程研究中心,福建福州350002

出　　处：《液晶与显示》2010年第2期215-219,共5页Chinese Journal of Liquid Crystals and Displays

基　　金：国家"863"计划平板显示重大专项(No.2008AA03A313);福建省科技厅资助省属高校项目(No.2008F5001);福州大学科技发展基金(No.2008-XY-11)

摘　　要：针对FED显示屏电极的特征,提出一种FED电极缺陷检测系统,用于检测FED电极的短路和断路等缺陷。系统分为硬件和软件两部分,硬件部分由CCD摄像头初始定位和对准模块、单片机数据测试和传输模块、计算机数据接收和处理模块组成;软件部分包括单片机预处理部分的底层程序设计和计算机部分面向对象的高级程序设计。经过硬件设计安装和软件编程调试,该FED电极缺陷检测系统已经在实验中得到应用。In allusion to the characteristics of the FED electrode,a kind of defect inspection system for FED electrodes is proposed in this paper,which can detect the defects of short circuit and open circuit,etc. The system includes hardware and software. The hardware is composed of CCD camera （initial location and orientation）,single-chip （data testing and transmission） and computer （data receiving and processing）. The software consists of program design of single-chip pretreatment and advanced programming of computer object orientation. The defect inspection system has been applied to the fabrication of FED electrodes after the design and installation of hardware and program debugging of software.

关 键 词：FED电极 CCD 单片机 VISUAL C++ 缺陷检测 

分 类 号：TP391[自动化与计算机技术—计算机应用技术]