微带有源相控阵互耦效应及校准方法研究  

Study on Mutual Coupling Effect and Calibration Methods in Microstrip Active Phased Array

作　　者：王国龙[1] 董涛[1] 杨红乔[1] 

机构地区：[1]北京卫星信息工程研究所,北京100086

出　　处：《无线电工程》2010年第5期43-45,共3页Radio Engineering

摘　　要：研究了小型微带有源相控阵天线中的互耦效应及其校准问题。分析了阵元间互耦对微带阵列天线阻抗特性和辐射特性的影响,对散射矩阵法在互耦校准中的适用性进行了分析,提出了基于有源方向图的互耦校准方法。仿真分析结果表明,对于强互耦情况下小型微带有源相控阵的校准,散射矩阵法存在较大的误差,而有源方向图法更加有效。The study focuses on the mutual coupling effect and its calibration methods in small microstrip active phased array.First,the mutual coupling effect on the input impedance and radiation characteristics is analyzed,and then the applicability of the calibration method based on the scattering matrix（SM）method is investigated.Finally,a novel calibration method based on the active element pattern（AEP）is proposed.Simulations indicate that the AEP method is more accurate than the SM method for the calibration in small microstrip active phased array having strong coupling between elements.

关 键 词：有源相控阵 互耦 校准 有源方向图 

分 类 号：TN99[电子电信—信号与信息处理]