PIN模块线性度测量方法及测量误差分析  

Linearity Measuring Method and Measuring Error Analysis of PIN Module

作　　者：张怡[1] 李洪玉[1] 肖清惠[1] 

机构地区：[1]重庆光电技术研究所,重庆400060

出　　处：《半导体光电》2010年第2期223-225,240,共4页Semiconductor Optoelectronics

摘　　要：介绍了一种PIN模块线性度参数测量的典型方法及测量系统,并对测量误差的主要来源进行了分析,阐述了测试系统性能和环境温度变化对测量结果的影响。One typical method for measuring the linearity parameters of PIN module is introduced and the main source of the measuring error is analyzed. The influence of both the performance of the measuring system and the changes of the ambient temperature on the measuring result is expounded.

关 键 词：线性度 测量系统 测量误差 

分 类 号：TN36[电子电信—物理电子学]