含双缺陷的一维准周期光子晶体的缺陷模特性  

Characteristics of Defect Mode of Quasi-periodic 1-D Photonic Crystal Containing Double Defects

作　　者：李文胜[1] 付艳华[1] 张琴[1] 是度芳[1,2] 

机构地区：[1]湖北汽车工业学院理学系,湖北十堰442002 [2]华中科技大学物理系,武汉430074

出　　处：《半导体光电》2010年第2期241-244,共4页Semiconductor Optoelectronics

基　　金：湖北省教育厅基金项目(Q200723001)

摘　　要：利用传输矩阵法,计算了含双缺陷的一维准周期光子晶体的透射谱,并侧重分析了缺陷模的特征。结果表明:当两缺陷层间距较小时,两缺陷模分裂的距离较大,对应的透射率较小;而当两缺陷层间的光学距离变大,两缺陷模的间距变小,缺陷膜的透射率增加。两缺陷模间的关联系数随两缺陷层间的光学厚度的增加而减少。缺陷层光学厚度增加时,缺陷模向长波方向平移,反之向短波方向移动。缺陷层光学厚度的变化对缺陷模的透射率几乎没有影响。The transmission spectra of quasi-periodic 1-D photonic crystal containing double defects was calculated with transfer matrix method, and the emphasis was put on the analysis of the characteristics of the defect mode. The results indicate that when the distance between two defect layers is smaller, the split distance of two defect modes is larger, and the corresponding transmittance is smaller. However, when the optical distance between two defect layers increases, the distance between two defect modes becomes smaller and the transmittance of defect modes increases. The correlation coefficient between two defect modes decreases with the optical thickness between two defect layers increasing.When the optical thickness of defect layer increases, the defect modes shift to the long-wave direction, or to the short-wave direction. Changes of the optical thickness of the defect layer exert little influence on the transmittance of the defect mode.

关 键 词：光子晶体 准周期 缺陷模 关联系数 

分 类 号：O734[理学—晶体学]