大功率白光LED加速寿命试验研究  

Experimental aging of high-power white LED

作　　者：赵阿玲[1] 贺卫利[1] 陈建新[1] 

机构地区：[1]北京工业大学电子信息与控制学院,北京100022

出　　处：《郑州轻工业学院学报（自然科学版）》2010年第1期65-68,共4页Journal of Zhengzhou University of Light Industry:Natural Science

基　　金：北京市教委项目(10200650)

摘　　要：对新型大功率GaN基蓝光芯片激发荧光粉发射白光的LED进行电流应力加速寿命测试和可靠性研究,考察白光LED主要性能参数随老化时间的变化,结果表明:经过5 000多小时的老化,光通量平均降至初始值的77.5%;发光效率变化趋势与光通量变化基本一致;峰值波长没有明显的变化趋势,而相关色温随老化时间增加逐渐升高;正向导通电压也随老化时间增加而升高.实验表明样品参数型失效主要包括发光效率的降低和荧光粉转换效率的降低.Current stress accelerated lifetime tests on 1W GaN based white LED were performed and its reliability were studied.Some key performance parameters of white LED changing with aging time were analyzed. The results showed that after more than 5 000 h aging,the average flux decreased to 77.5%of the initial flux;the peak wavelength did not show apparent changing trend with aging time;correlated color temperature increased with aging time;and so as the voltage.According to experimental results,the main reasons of parametric failure include optical efficiency degradation and phosphor degeneration.

关 键 词：白光LED 寿命试验 失效分析 

分 类 号：TN384[电子电信—物理电子学]