稳态总剂量效应(TID)试验剂量率选择的研究  

Study on The Choice of Dose Rate of Total Ionizing Dose Test

作　　者：王群勇 刘燕芳 陈宇 姜大勇 白桦 

机构地区：[1]北京圣涛平试验工程技术研究院有限责任公司,北京100089

出　　处：《核电子学与探测技术》2010年第2期222-228,共7页Nuclear Electronics & Detection Technology

摘　　要：通过调研分析,发现ESA/SCC 22900和MIL-STD-883G方法1019.7在剂量率的选择等方面存在较大差异。针对美国宇航局NASA发布的TID试验报告中总剂量及其对应的剂量率值进行统计分析,了解到不同工艺器件进行TID试验时采取多步骤辐射,辐射过程中所选择的剂量率几乎均小于1rad(Si)/s,且剂量率随总剂量不断改变。当总剂量低于30krad(Si)时,曲线分布没有规律,随机性较大;当总剂量大于30krad(Si)时,剂量率随总剂量的增加而增加,但不满足线性关系。针对不同剂量率辐射后器件失效机理的分析研究,得出器件在低剂量率辐射下失效的主要原因是界面态,而在高剂量率辐射失效的主要原因是辐射感生氧化物陷阱电荷。The paper points out that there are differences in dose rate between the ESA/SCC 22900 and the MIL-STD-883G TM 1019. 7. The total dose and relevant dose rate of TID test reports from NASA are analysed. Step radiation method is used to different technical devices. The dose rate is nearly all less than 1rad（Si）/s and is changed by the total dose. When the total dose is less than 30krad（Si）, the curve distribution of the dose rate is randomness, which exhibits no regularity between total close and dose rate. When the total dose is greater than 30krad（Si）, the close rate increases by the total dose, but it dose not linear relation. The reason of the failure is interface state at low dose rate radiation and oxide trap charge at high dose rate radiation.

关 键 词：稳态总剂量 剂量率 界面态 氧化物陷阱电荷 

分 类 号：TN386.1[电子电信—物理电子学]