小型断路器可靠性增长的研究  

Research on Reliability Growth of MCB

作　　者：卜浩民 胡伟芳 张兰晶 李兴伟 

机构地区：[1]上海良信电器股份有限公司,上海200137

出　　处：《低压电器》2010年第7期1-5,30,共6页Low Voltage Apparatus

摘　　要：提出了小型断路器的可靠性故障模式和试验方法。以NDM1小型断路器为样本,按照产品标准规定的寿命指标、设定的操作失效率和瞬动保护成功率等级,验证了产品的可靠性。为探讨该断路器更高的可靠性水平,又在高于寿命指标和提高可靠性等级设定下进行了可靠性试验。分析了试验中暴露的产品薄弱点,从而提出进一步改进的方向。The fault mode and test method of reliability of miniature circuit breaker （MCB） were proposed. Taking example for NDM1 MCB, the product reliability was validated according to endurance index set by standard, level of invalidation rate of operation and success rate of instantaneous protection. The reliability test under higher level of endurance index and reliability was done to discuss higher reliability level of the MCB. The weakness of product exposed in test was analyzed for further improvement.

关 键 词：小型断路器 可靠性 故障模式 瞬动保护成功率 

分 类 号：TM561[电气工程—电器]