SiO_2二次纳米粒子热处理后微结构变化的TEM观察  

TEM Observation of Microstructural Changes on the Silica Secondary Particles after Heated-treatment

作　　者：王新[1] 刘孝恒[1] 汪信[1] 

机构地区：[1]南京理工大学软化学与功能材料教育部重点实验室,南京210094

出　　处：《硅酸盐通报》2010年第2期454-457,共4页Bulletin of the Chinese Ceramic Society

基　　金：国家自然科学基金项目(No.50772048)

摘　　要：本文通过透射电子显微镜(TEM)观察到由空气-水界面上生成的SiO2二次纳米粒子煅烧后所发生的微结构变化,探讨了变化机理。结果表明:SiO2二次粒子中一次粒子的直径在400℃煅烧后从外向里呈现递减变化;外层粒子受热长大形成堆积孔,导致内部较小的一次粒子通过堆积孔的空隙在超声震荡下散逸出来。TEM was successfully applied to observe the microstructural changes of air-water interfacial SiO2 secondary particles and the transformation mechanism were investigated in this paper. The results indicated that the size of primary particle in the secondary particle showed gradient variations from the inside to out after heated at 400 ℃, the outside primary particles were converted into the piled-pore structure at high temperature. Thus the inside primary particles with smaller size could diffuse into solution through the piled-pores under ultrasonic treatment .

关 键 词：SiO2二次粒子 热处理 梯度变化 

分 类 号：TB33[一般工业技术—材料科学与工程]