并行测试的一种新策略——测试段划分  

Parallel Testing Based on Test Subsession Partitioning

作　　者：向东[1] 

机构地区：[1]清华大学微电子学研究所

出　　处：《电子学报》1999年第2期29-31,28,共4页Acta Electronica Sinica

基　　金：国家自然科学基金;国家九五攻关项目资助课题

摘　　要：由于测试响应观察及测试码置入只占用了测试时间的一部分，我们采用测试段划分策略来进一步利用测试调度资源．这样，原来在测试设计调度过程中冲突的子电路对采用测试段划分策略以后可能只是部分冲突了．文中提出了一种新的测试调度算法．该算法通过记录以往的冲突信息，提高了测试调度最优解的搜索效率．Considering the fact that test response observation and test application only use a fraction of test time,a test subsession partitioning scheme is presented.Some further sources of the test scheduling problem can be used.Subcircuits in conflict in the process of test are only partially in conflict now.A new test scheduling algorthm is proposed after the test subsession partitioning scheme has been combined.The effectiveness to search the test scheduling solution is improved greatly by using the previous conflict information.

关 键 词：并行测试 测试调度 并行测试图 顶点着色 

分 类 号：TN790.7[电子电信—电路与系统]