直接数字频率合成器中的相位噪声分析  

Analysis of Phase Noise in DDS

作　　者：张骏凌[1] 张玉兴[1] 

机构地区：[1]电子科技大学电子工程系

出　　处：《电子科技大学学报》1999年第1期24-27,共4页Journal of University of Electronic Science and Technology of China

基　　金：国家"九五"重点科研项目

摘　　要：相位噪声和杂散性能是制约直接数字频率合成器（ＤＤＳ）用于高稳定频率源的关键指标。文中给出了一种全新思维，定量分析了ＤＤＳ中由相位截断引起的杂散谱及由相位截断、ＲＯＭ存储器有限字长和ＤＡＣ性能对其相位噪声性能的影响。Phase noise and spurious spectrum are the key characters in direct digital synthesizers (DDS)applied in the high stable frequency source. Actually, the poor performance of spurious spectrum from DDS hasalways restrained its applications. This paper introduces a new way to analyze the spurious spectrum and phasenoise generated by the phase truncation. The locations and amplitudes of spurious spectrum are preciselydtermined. Phase noise generated by the size of ROM look-up table and the performance of DAC is alsoinvestigated.

关 键 词：直接 数字频率合成器 相位截断 相位噪声 

分 类 号：TN74[电子电信—电路与系统]