含镜面反射面形的傅里叶变换轮廓术  

Fourier Transform Profilometry for Surface with Specular Reflection

作　　者：陈利娟[1] 徐利华[1] 

机构地区：[1]西南交通大学物理科学与技术学院,四川成都610031

出　　处：《光学学报》2010年第5期1349-1353,共5页Acta Optica Sinica

基　　金：西南交通大学基础研究基金(2007B18)资助课题

摘　　要：对于反射光含镜面反射的物体而言,由于镜面反射的存在,将会导致图像中存在许多的高亮区。因为镜面反射光强相对较强,因此图像中高亮区镜面反射光会不可避免地掩盖漫反射光场分布中的相位信息,从而导致错误的三维面形测量。从分析傅里叶变换轮廓术中光场的偏振特性出发,利用光学器件的滤光作用,结合现有傅里叶变换轮廓术和Phong光照模型,实现了含镜面反射的物体面形的三维测量。理论分析与实验结果均证明了镜面反射将影响调制光场的高度分布,并且还证明了提出的测量方法可有效消除投影光源造成的高反光区域,极大地扩展了傅里叶变换轮廓术的测量领域。Because of the specular reflection of the object,there must be many hight-light areas in the image.The intensity of the specular reflection is relatively strong,so phase information of structured optical field is inevitably covered up by specular reflection.If the reflected light field of the surface with specular reflection by general Fourier transform profilometry is directly measured,wrong 3D surface data must occur.According to polarization properties of the light field,using light-filtering function of optical components,and combining Fourier transform profilometry with Phong illumination model,3D surface of the object with specular reflection can be correctly measured.Both theoretical analysis and experimental results not only prove that specular reflection will affect the modulation field of the surface,but also prove that the proposed measurement method can measure the surface with specular reflection.So application fields of Fourier transform profilometry could be greatly expanded.

关 键 词：表面光学 高光的消除 傅里叶变换轮廓术 镜面反射 PHONG光照模型 

分 类 号：TN247[电子电信—物理电子学]